Brecht Truijen, Barry J. O'Sullivan, Md. Nurul Alam, Dieter Claes, M. Thesberg, Philippe Roussel, Adrian Chasin, Geert Van den bosch, Ben Kaczer, Jan Van Houdt. Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 12-1, IEEE, 2022. [doi]
@inproceedings{TruijenOACTRCBK22,
title = {Trap-polarization interaction during low-field trap characterization on hafnia-based ferroelectric gatestacks},
author = {Brecht Truijen and Barry J. O'Sullivan and Md. Nurul Alam and Dieter Claes and M. Thesberg and Philippe Roussel and Adrian Chasin and Geert Van den bosch and Ben Kaczer and Jan Van Houdt},
year = {2022},
doi = {10.1109/IRPS48227.2022.9764603},
url = {https://doi.org/10.1109/IRPS48227.2022.9764603},
researchr = {https://researchr.org/publication/TruijenOACTRCBK22},
cites = {0},
citedby = {0},
pages = {12},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7950-9},
}