Efficient test-point selection for scan-based BIST

Huan-Chih Tsai, Kwang-Ting Cheng, Chih-Jen Lin, Sudipta Bhawmik. Efficient test-point selection for scan-based BIST. IEEE Trans. VLSI Syst., 6(4):667-676, 1998. [doi]

Abstract

Abstract is missing.