Jeng-Horng Tsai, Ming-Jun Hsiao, Tsin-Yuan Chang. An Embedded Built-in-Self-Test Approach for Digital-to-Analog Converters. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 423, IEEE Computer Society, 2001. [doi]
Abstract is missing.