External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Design of 2�?VDD-Tolerant I/O Buffer with Considerations of Gate-Oxide Reliability and Hot-Carrier Degradation

Hui-Wen Tsai, Ming-Dou Ker. Design of 2�?VDD-Tolerant I/O Buffer with Considerations of Gate-Oxide Reliability and Hot-Carrier Degradation. In 14th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2007, Marrakech, Morocco, December 11-14, 2007. pages 1240-1243, IEEE, 2007. [doi]

Authors

Hui-Wen Tsai

This author has not been identified. Look up 'Hui-Wen Tsai' in Google

Ming-Dou Ker

This author has not been identified. Look up 'Ming-Dou Ker' in Google
runs on