Hui-Wen Tsai, Ming-Dou Ker. Design of 2�?VDD-Tolerant I/O Buffer with Considerations of Gate-Oxide Reliability and Hot-Carrier Degradation. In 14th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2007, Marrakech, Morocco, December 11-14, 2007. pages 1240-1243, IEEE, 2007. [doi]
@inproceedings{TsaiK07-0,
title = {Design of 2�?VDD-Tolerant I/O Buffer with Considerations of Gate-Oxide Reliability and Hot-Carrier Degradation},
author = {Hui-Wen Tsai and Ming-Dou Ker},
year = {2007},
doi = {10.1109/ICECS.2007.4511221},
url = {http://dx.doi.org/10.1109/ICECS.2007.4511221},
researchr = {https://researchr.org/publication/TsaiK07-0},
cites = {0},
citedby = {0},
pages = {1240-1243},
booktitle = {14th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2007, Marrakech, Morocco, December 11-14, 2007},
publisher = {IEEE},
isbn = {978-1-4244-1377-5},
}