Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh. MINVDD Testing for Weak CMOS ICs. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 339-345, IEEE Computer Society, 2001. [doi]
@inproceedings{TsengCMN01,
title = {MINVDD Testing for Weak CMOS ICs},
author = {Chao-Wen Tseng and Ray Chen and Edward J. McCluskey and Phil Nigh},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/vts/2001/1122/00/11220339abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/TsengCMN01},
cites = {0},
citedby = {0},
pages = {339-345},
booktitle = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1122-8},
}