Analysis of within-die process variation in 65nm FPGAs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Tim Tuan, Austin Lesea, Chris Kingsley, Steven Trimberger. Analysis of within-die process variation in 65nm FPGAs. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 716-720, IEEE, 2011. [doi]

This author has not been identified. Look up 'Tim Tuan' in GoogleThis author has not been identified. Look up 'Austin Lesea' in GoogleThis author has not been identified. Look up 'Chris Kingsley' in GoogleThis author has not been identified. Look up 'Steven Trimberger' in Google

runs on WebDSL