Tim Tuan, Austin Lesea, Chris Kingsley, Steven Trimberger. Analysis of within-die process variation in 65nm FPGAs. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 716-720, IEEE, 2011. [doi]
@inproceedings{TuanLKT11,
title = {Analysis of within-die process variation in 65nm FPGAs},
author = {Tim Tuan and Austin Lesea and Chris Kingsley and Steven Trimberger},
year = {2011},
doi = {10.1109/ISQED.2011.5770808},
url = {http://dx.doi.org/10.1109/ISQED.2011.5770808},
tags = {analysis},
researchr = {https://researchr.org/publication/TuanLKT11},
cites = {0},
citedby = {0},
pages = {716-720},
booktitle = {Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011},
publisher = {IEEE},
isbn = {978-1-61284-914-0},
}