Tim Tuan, Austin Lesea, Chris Kingsley, Steven Trimberger. Analysis of within-die process variation in 65nm FPGAs. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 716-720, IEEE, 2011. [doi]
Abstract is missing.