Stanislav Tyaginov, Ivan Starkov, Oliver Triebl, J. Cervenka, C. Jungemann, S. Carniello, J. M. Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, E. Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser. Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectronics Reliability, 50(9-11):1267-1272, 2010. [doi]
@article{TyaginovSTCJCPEKKSMCG10,
title = {Interface traps density-of-states as a vital component for hot-carrier degradation modeling},
author = {Stanislav Tyaginov and Ivan Starkov and Oliver Triebl and J. Cervenka and C. Jungemann and S. Carniello and J. M. Park and Hubert Enichlmair and Markus Karner and Ch. Kernstock and E. Seebacher and Rainer Minixhofer and Hajdin Ceric and Tibor Grasser},
year = {2010},
doi = {10.1016/j.microrel.2010.07.030},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.030},
tags = {modeling, C++},
researchr = {https://researchr.org/publication/TyaginovSTCJCPEKKSMCG10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1267-1272},
}