Interface traps density-of-states as a vital component for hot-carrier degradation modeling - researchr publication related

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Stanislav Tyaginov, Ivan Starkov, Oliver Triebl, J. Cervenka, C. Jungemann, S. Carniello, J. M. Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, E. Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser. Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectronics Reliability, 50(9-11):1267-1272, 2010. [doi]

The following publications are possibly variants of this publication:

Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random DopantsAlexander Makarov, Dimitri Linten, Stanislav Tyaginov, Ben Kaczer, Philippe Roussel, Adrian Chasin, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Markus Jech, Tibor Grasser. essderc 2019: 262-265 [doi]

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