Stanislav Tyaginov, Ivan Starkov, Oliver Triebl, J. Cervenka, C. Jungemann, S. Carniello, J. M. Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, E. Seebacher, Rainer Minixhofer, Hajdin Ceric, Tibor Grasser. Interface traps density-of-states as a vital component for hot-carrier degradation modeling. Microelectronics Reliability, 50(9-11):1267-1272, 2010. [doi]
Abstract is missing.