Thermal-aware CMOS: Challenges for future technology and design evolutions

Ken Uchida, Tsunaki Takahashi. Thermal-aware CMOS: Challenges for future technology and design evolutions. In 46th European Solid-State Device Research Conference, ESSDERC 2016, Lausanne, Switzerland, September 12-15, 2016. pages 150-153, IEEE, 2016. [doi]

Authors

Ken Uchida

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Tsunaki Takahashi

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