Ken Uchida - researchr alias

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Viewing Publication 1 - 17 from 17

2024

Design and analysis of a high-speed low-power comparator with regeneration enhancement and through current suppression techniques from 4 K to 300 K in 65-nm Cryo-CMOSChia-Wei Pai, Ken Uchida, Munehiro Tada, Hiroki Ishikuro. mj, 144:106066, February 2024. [doi]

A Cryo-CMOS 10-bit 60-MS/s SAR ADC with common-mode variation suppression switching scheme and gain boosting dynamic comparatorChia-Wei Pai, Ken Uchida, Munehiro Tada, Hiroki Ishikuro. mj, 153:106435, 2024. [doi]

2022

Enhanced Drain Current in Transient Mode due to Long Ionization Time of Shallow Impurities at 4 K in 65-nm bulk Cryo CMOS TransistorsTomohisa Miyao, Takahisa Tanaka, Itsuki Imanishi, Masayuki Ichikawa, Shuya Nakagawa, Hiroki Ishikuro, Toshitsugu Sakamoto, Munehiro Tada, Ken Uchida. drc 2022: 1-2 [doi]

2020

A Wide Range and High Accuracy Sensor Interface with Switching Regulator for Coin-Cell Powered Tiny Wireless Sensor NodeK. Tatehora, Yohsuke Shiiki, S. Nakagawa, Takahisa Tanaka, Ken Uchida, Hiroki Ishikuro. iscas 2020: 1-4 [doi]

2017

The Destiny-class CyberCANOE - a surround screen, stereoscopic, cyber-enabled collaboration analysis navigation and observation environmentNoel Kawano, Ryan Theriot, Jack Lam, Eric Wu, Andrew Guagliardo, Dylan Kobayashi, Alberto Gonzalez, Ken Uchida, Jason Leigh. ervr 2017: 25-30 [doi]

2016

Thermal-aware CMOS: Challenges for future technology and design evolutionsKen Uchida, Tsunaki Takahashi. essderc 2016: 150-153 [doi]

2014

Delay Time Component of InGaAs MOSFET Caused by Dynamic Source ResistanceMasayuki Yamada, Ken Uchida, Yasuyuki Miyamoto. ieicet, 97-C(5):419-422, 2014. [doi]

2011

Using contexts to supervise a collaborative processAvelino J. Gonzalez, Setsuo Tsuruta, Yoshitaka Sakurai, Johann Nguyen, Kouhei Takada, Ken Uchida. aiedam, 25(1):25-40, 2011. [doi]

2010

2009

Single-electron devices for ubiquitous and secure computing applicationsKen Uchida. dac 2009: 301-303 [doi]

2008

2006

Si Nanocrystal MOSFET with Silicon Nitride Tunnel Insulator for High-rate Random Number GenerationRyuji Ohba, Daisuke Matsushita, Koichi Muraoka, Shinichi Yasuda, Tetsufumi Tanamoto, Ken Uchida, Shinobu Fujita. isvlsi 2006: 231-236 [doi]

2004

Physical random number generator based on MOS structure after soft breakdownShinichi Yasuda, Hideki Satake, Tetsufumi Tanamoto, Ryuji Ohba, Ken Uchida, Shinobu Fujita. jssc, 39(8):1375-1377, 2004. [doi]

1989

Yield and reliability of MNOS EEPROM productsYoshiaki Kamigaki, Shin-Ichi Minami, Takaaki Hagiwara, Kazunori Furusawa, Takeshi Furuno, Ken Uchida, Masaaki Terasawa, Koubu Yamazaki. jssc, 24(6):1714-1722, December 1989. [doi]

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