Physical random number generator based on MOS structure after soft breakdown

Shinichi Yasuda, Hideki Satake, Tetsufumi Tanamoto, Ryuji Ohba, Ken Uchida, Shinobu Fujita. Physical random number generator based on MOS structure after soft breakdown. J. Solid-State Circuits, 39(8):1375-1377, 2004. [doi]

Abstract

Abstract is missing.