Jon G. Jr. Udell, Edward J. McCluskey. Pseudo-exhaustive test and segmentation: formal definitions and extended fault coverage results. In Proceedings of the Nineteenth International Symposium on Fault-Tolerant Computing, FTCS 1989, Chicago, IL, USA, 21-23 June, 1989. pages 292-298, IEEE Computer Society, 1989. [doi]
Abstract is missing.