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Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs under Switching Operation

Aoi Ueda, Michihiro Shintani, Michiko Inoue, Takashi Sato. Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs under Switching Operation. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-6, IEEE, 2020. [doi]

Authors

Aoi Ueda

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Michihiro Shintani

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Michiko Inoue

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Takashi Sato

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