Aoi Ueda, Michihiro Shintani, Michiko Inoue, Takashi Sato. Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs under Switching Operation. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{UedaSIS20, title = {Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs under Switching Operation}, author = {Aoi Ueda and Michihiro Shintani and Michiko Inoue and Takashi Sato}, year = {2020}, doi = {10.1109/ATS49688.2020.9301598}, url = {https://doi.org/10.1109/ATS49688.2020.9301598}, researchr = {https://researchr.org/publication/UedaSIS20}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020}, publisher = {IEEE}, isbn = {978-1-7281-7467-9}, }