Aoi Ueda, Michihiro Shintani, Michiko Inoue, Takashi Sato. Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs under Switching Operation. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.