Satoshi Uemori, Masamichi Ishii, Haruo Kobayashi, Daiki Hirabayashi, Yuta Arakawa, Yuta Doi, Osamu Kobayashi, Tatsuji Matsuura, Kiichi Niitsu, Yuji Yano, Tatsuhiro Gake, Takahiro J. Yamaguchi, Nobukazu Takai. Multi-bit Sigma-Delta TDC Architecture with Improved Linearity. J. Electronic Testing, 29(6):879-892, 2013. [doi]
Abstract is missing.