Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Taiki Uemura, Ryo Tanabe, Yoshiharu Tosaka, Shigeo Satoh. Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs. In 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece. pages 117-122, IEEE, 2008. [doi]

This author has not been identified. Look up 'Taiki Uemura' in GoogleThis author has not been identified. Look up 'Ryo Tanabe' in GoogleThis author has not been identified. Look up 'Yoshiharu Tosaka' in GoogleThis author has not been identified. Look up 'Shigeo Satoh' in Google

runs on WebDSL