Taiki Uemura, Ryo Tanabe, Yoshiharu Tosaka, Shigeo Satoh. Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs. In 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece. pages 117-122, IEEE, 2008. [doi]
@inproceedings{UemuraTTS08,
title = {Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs},
author = {Taiki Uemura and Ryo Tanabe and Yoshiharu Tosaka and Shigeo Satoh},
year = {2008},
doi = {10.1109/IOLTS.2008.28},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2008.28},
researchr = {https://researchr.org/publication/UemuraTTS08},
cites = {0},
citedby = {0},
pages = {117-122},
booktitle = {14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece},
publisher = {IEEE},
isbn = {978-0-7695-3264-6},
}