Taiki Uemura, Ryo Tanabe, Yoshiharu Tosaka, Shigeo Satoh. Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs. In 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece. pages 117-122, IEEE, 2008. [doi]
Abstract is missing.