Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits

Taiki Utsunomiya, Ryu Hoshino, Kohei Miyase, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara. Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits. In IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022. pages 43-48, IEEE, 2022. [doi]

Authors

Taiki Utsunomiya

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Ryu Hoshino

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Kohei Miyase

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Shyue-Kung Lu

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Xiaoqing Wen

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Seiji Kajihara

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