Taiki Utsunomiya, Ryu Hoshino, Kohei Miyase, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara. Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits. In IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022. pages 43-48, IEEE, 2022. [doi]
@inproceedings{UtsunomiyaHMLWK22,
title = {Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits},
author = {Taiki Utsunomiya and Ryu Hoshino and Kohei Miyase and Shyue-Kung Lu and Xiaoqing Wen and Seiji Kajihara},
year = {2022},
doi = {10.1109/ITCAsia55616.2022.00018},
url = {https://doi.org/10.1109/ITCAsia55616.2022.00018},
researchr = {https://researchr.org/publication/UtsunomiyaHMLWK22},
cites = {0},
citedby = {0},
pages = {43-48},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022},
publisher = {IEEE},
isbn = {978-1-6654-5523-7},
}