A methodology for validating digital circuits with mutation testing - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Patrice Vado, Yvon Savaria, Yannick Zoccarato, Chantal Robach. A methodology for validating digital circuits with mutation testing. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 343-346, IEEE, 2000. [doi]

This author has not been identified. Look up 'Patrice Vado' in GoogleThis author has not been identified. Look up 'Yvon Savaria' in GoogleThis author has not been identified. Look up 'Yannick Zoccarato' in GoogleThis author has not been identified. Look up 'Chantal Robach' in Google

runs on WebDSL