Michiel Vandemaele, Ben Kaczer, Stanislav Tyaginov, Zlatan Stanojevic, Alexander Makarov, Adrian Chasin, Erik Bury, Hans Mertens, Dimitri Linten, Guido Groeseneken. d) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-7, IEEE, 2019. [doi]
@inproceedings{VandemaeleKTSMC19,
title = {d) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs},
author = {Michiel Vandemaele and Ben Kaczer and Stanislav Tyaginov and Zlatan Stanojevic and Alexander Makarov and Adrian Chasin and Erik Bury and Hans Mertens and Dimitri Linten and Guido Groeseneken},
year = {2019},
doi = {10.1109/IRPS.2019.8720406},
url = {https://doi.org/10.1109/IRPS.2019.8720406},
researchr = {https://researchr.org/publication/VandemaeleKTSMC19},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}