Analog/Digital Testing of Loaded Boards Without Dedicated Test Points - researchr publication authors

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Christophe Vaucher, Louis Balme. Analog/Digital Testing of Loaded Boards Without Dedicated Test Points. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 325-332, IEEE Computer Society, 1996.

This author has not been identified. Look up 'Christophe Vaucher' in GoogleThis author has not been identified. Look up 'Louis Balme' in Google

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