Christophe Vaucher, Louis Balme. Analog/Digital Testing of Loaded Boards Without Dedicated Test Points. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 325-332, IEEE Computer Society, 1996.
@inproceedings{VaucherB96,
title = {Analog/Digital Testing of Loaded Boards Without Dedicated Test Points},
author = {Christophe Vaucher and Louis Balme},
year = {1996},
tags = {testing},
researchr = {https://researchr.org/publication/VaucherB96},
cites = {0},
citedby = {0},
pages = {325-332},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}