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Srikanth Venkataraman. DFM, DFY, Debug and Diagnosis: The Loop to Ensure Yield. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 5, IEEE Computer Society, 2007. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product YieldDavid Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman. vlsid 2006: 14 [doi] Tutorial T3: DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product YieldSrikanth Venkataraman, Nagesh Tamarapalli. vlsid 2012: 16-17 [doi] DFM / DFT / SiliconDebug / DiagnosisSrikanth Venkataraman, Nagesh Tamarapalli. vlsid 2008: 5-6 [doi]
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