Srikanth Venkataraman, W. Kent Fuchs. Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits. In 10th International Conference on VLSI Design (VLSI Design 1997), 4-7 January 1997, Hyderabad, India. pages 381-387, IEEE Computer Society, 1997. [doi]
@inproceedings{VenkataramanF97,
title = {Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits},
author = {Srikanth Venkataraman and W. Kent Fuchs},
year = {1997},
doi = {10.1109/ICVD.1997.568157},
url = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1997.568157},
tags = {diagnostics},
researchr = {https://researchr.org/publication/VenkataramanF97},
cites = {0},
citedby = {0},
pages = {381-387},
booktitle = {10th International Conference on VLSI Design (VLSI Design 1997), 4-7 January 1997, Hyderabad, India},
publisher = {IEEE Computer Society},
}