Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits

Srikanth Venkataraman, W. Kent Fuchs. Distributed Diagnostic Simulation of Stuck-At Faults in Sequential Circuits. In 10th International Conference on VLSI Design (VLSI Design 1997), 4-7 January 1997, Hyderabad, India. pages 381-387, IEEE Computer Society, 1997. [doi]

Abstract

Abstract is missing.