The following publications are possibly variants of this publication:
- Diagnostic simulation of stuck-at faults in sequential circuits using compact listsIsmed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty. todaes, 6(4):471-489, 2001. [doi]
- Diagnostic simulation of stuck-at faults in combinational circuitsSreejit Chakravarty, Yiming Gong, Srikanth Venkataraman. et, 8(1):87-97, 1996. [doi]
- Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact ListsSrikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs, Elizabeth M. Rudnick, Sreejit Chakravarty, Janak H. Patel. dac 1995: 133-138 [doi]
- Diagnostic Fault Simulation of Sequential CircuitsElizabeth M. Rudnick, W. Kent Fuchs, Janak H. Patel. itc 1992: 178-186
- Diagnostic Simulation of Sequential Circuits Using Fault SamplingSrikanth Venkataraman, W. Kent Fuchs, Janak H. Patel. vlsid 1998: 476-481 [doi]
- Dynamic diagnosis of sequential circuits based on stuck-at faultsSrikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs. vts 1996: 198-203 [doi]