Raguraman Venkatesan, Jeffrey A. Davis, James D. Meindl. A physical model for the transient response of capacitively loaded distributed rlc interconnects. In Proceedings of the 39th Design Automation Conference, DAC 2002, New Orleans, LA, USA, June 10-14, 2002. pages 763-766, ACM, 2002. [doi]
Abstract is missing.