Improvement of analog circuit fault detectability using fault detection observers

Wolfgang Vermeiren, Wolfgang Straube, Günter Elst. Improvement of analog circuit fault detectability using fault detection observers. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 218-224, IEEE, 1993. [doi]

Authors

Wolfgang Vermeiren

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Wolfgang Straube

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Günter Elst

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