Wolfgang Vermeiren, Wolfgang Straube, Günter Elst. Improvement of analog circuit fault detectability using fault detection observers. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 218-224, IEEE, 1993. [doi]
@inproceedings{VermeirenSE93, title = {Improvement of analog circuit fault detectability using fault detection observers}, author = {Wolfgang Vermeiren and Wolfgang Straube and Günter Elst}, year = {1993}, doi = {10.1109/VTEST.1993.313321}, url = {http://dx.doi.org/10.1109/VTEST.1993.313321}, researchr = {https://researchr.org/publication/VermeirenSE93}, cites = {0}, citedby = {0}, pages = {218-224}, booktitle = {11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA}, publisher = {IEEE}, isbn = {0-8186-3830-3}, }