Improvement of analog circuit fault detectability using fault detection observers

Wolfgang Vermeiren, Wolfgang Straube, G√ľnter Elst. Improvement of analog circuit fault detectability using fault detection observers. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 218-224, IEEE, 1993. [doi]

Abstract

Abstract is missing.