Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. Yield Improvement, Fault-Tolerance to the Rescue?. In 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece. pages 165-166, IEEE, 2008. [doi]
Abstract is missing.