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On the need for a new ESD verification methodology to improve the reliability of ICs in advanced 28nm UTBB FD-SOI technology

B. Viale, M. Fer, L. Courau, Philippe Galy, Bruno Allard. On the need for a new ESD verification methodology to improve the reliability of ICs in advanced 28nm UTBB FD-SOI technology. Microelectronics Reliability, 64:101-108, 2016. [doi]

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