Saru Vig, Tan Yng Tzer, Guiyuan Jiang, Siew Kei Lam. Customizing Skewed Trees for Fast Memory Integrity Verification in Embedded Systems. In 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017. pages 213-218, IEEE, 2017. [doi]
Abstract is missing.