Customizing Skewed Trees for Fast Memory Integrity Verification in Embedded Systems - researchr publication related

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Saru Vig, Tan Yng Tzer, Guiyuan Jiang, Siew Kei Lam. Customizing Skewed Trees for Fast Memory Integrity Verification in Embedded Systems. In 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017. pages 213-218, IEEE, 2017. [doi]

The following publications are possibly variants of this publication:

Dynamic skewed tree for fast memory integrity verificationSaru Vig, Guiyuan Jiang, Siew Kei Lam. date 2018: 642-647 [doi]

Framework for Fast Memory Authentication Using Dynamically Skewed Integrity TreeSaru Vig, Rohan Juneja, Guiyuan Jiang, Siew Kei Lam, Changhai Ou. tvlsi, 27(10):2331-2343, 2019. [doi]

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