Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths

Hector Villacorta, Charles F. Hawkins, Víctor H. Champac, Jaume Segura, Roberto Gómez. Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths. IEEE Design & Test of Computers, 30(6):70-79, 2013. [doi]

Abstract

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