Variability in Fully Depleted MOSFETs - researchr publication authors

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Maud Vinet, T. Hook, Yannick Le Tiec, R. Murphy, Shom Ponoth, Laurent Grenouillet, Romain Wacquez. Variability in Fully Depleted MOSFETs. In IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012. pages 1-3, IEEE, 2012. [doi]

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