Variability in Fully Depleted MOSFETs - researchr publication related

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Maud Vinet, T. Hook, Yannick Le Tiec, R. Murphy, Shom Ponoth, Laurent Grenouillet, Romain Wacquez. Variability in Fully Depleted MOSFETs. In IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012. pages 1-3, IEEE, 2012. [doi]

The following publications are possibly variants of this publication:

Fast Measurement of BTI on 28nm Fully Depleted Silicon-On-Insulator MOSFETs at Cryogenic Temperature down to 4KLauriane Contamin, Mikaël Cassé, Xavier Garros, Fred Gaillard, Maud Vinet, Philippe Galy, André Juge, Emmanuel Vincent 0004, Silvano De Franceschi, Tristan Meunier. irps 2022: 7 [doi]

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