Maud Vinet, T. Hook, Yannick Le Tiec, R. Murphy, Shom Ponoth, Laurent Grenouillet, Romain Wacquez. Variability in Fully Depleted MOSFETs. In IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012. pages 1-3, IEEE, 2012. [doi]
@inproceedings{VinetHTMPGW12, title = {Variability in Fully Depleted MOSFETs}, author = {Maud Vinet and T. Hook and Yannick Le Tiec and R. Murphy and Shom Ponoth and Laurent Grenouillet and Romain Wacquez}, year = {2012}, doi = {10.1109/ICICDT.2012.6232868}, url = {http://dx.doi.org/10.1109/ICICDT.2012.6232868}, researchr = {https://researchr.org/publication/VinetHTMPGW12}, cites = {0}, citedby = {0}, pages = {1-3}, booktitle = {IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012}, publisher = {IEEE}, isbn = {978-1-4673-0146-6}, }