Maud Vinet, T. Hook, Yannick Le Tiec, R. Murphy, Shom Ponoth, Laurent Grenouillet, Romain Wacquez. Variability in Fully Depleted MOSFETs. In IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012. pages 1-3, IEEE, 2012. [doi]
@inproceedings{VinetHTMPGW12,
title = {Variability in Fully Depleted MOSFETs},
author = {Maud Vinet and T. Hook and Yannick Le Tiec and R. Murphy and Shom Ponoth and Laurent Grenouillet and Romain Wacquez},
year = {2012},
doi = {10.1109/ICICDT.2012.6232868},
url = {http://dx.doi.org/10.1109/ICICDT.2012.6232868},
researchr = {https://researchr.org/publication/VinetHTMPGW12},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012},
publisher = {IEEE},
isbn = {978-1-4673-0146-6},
}