Delay Fault Testing: Choosing Between Random SIC and Random MIC Test Sequences

Arnaud Virazel, René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch. Delay Fault Testing: Choosing Between Random SIC and Random MIC Test Sequences. J. Electronic Testing, 17(3-4):233-241, 2001. [doi]

Abstract

Abstract is missing.