Output Timing Measurement Using an Idd Method

Jörg E. Vollrath. Output Timing Measurement Using an Idd Method. In 11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA. pages 43-46, IEEE Computer Society, 2003. [doi]

Authors

Jörg E. Vollrath

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