Jörg E. Vollrath. Output Timing Measurement Using an Idd Method. In 11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA. pages 43-46, IEEE Computer Society, 2003. [doi]
@inproceedings{Vollrath03, title = {Output Timing Measurement Using an Idd Method}, author = {Jörg E. Vollrath}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/mtdt/2003/2004/00/20040043abs.htm}, tags = {e-science}, researchr = {https://researchr.org/publication/Vollrath03}, cites = {0}, citedby = {0}, pages = {43-46}, booktitle = {11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-2004-9}, }