Jörg E. Vollrath - researchr alias

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Viewing Publication 1 - 17 from 17

2018

Open Access Microelectronics CourseJörg E. Vollrath. ewme 2018: 1-4 [doi]

2015

An open access minimum automatic task generation live feedback system for electrical engineeringJörg E. Vollrath. educon 2015: 494-498 [doi]

2014

Interactive tools for teaching electrical engineeringJörg E. Vollrath. educon 2014: 129-133 [doi]

2013

Using models, simulation and measurements for teaching circuit designJörg E. Vollrath. educon 2013: 978-983 [doi]

2006

DRAM-Specific Space of Memory TestsZaid Al-Ars, Said Hamdioui, A. J. van de Goor, Georgi Gaydadjiev, Jörg E. Vollrath. itc 2006: 1-10 [doi]

DDR2 DRAM Output Timing OptimizationJörg E. Vollrath, Jürg Schwizer, Marcin Gnat, Ralf Schneider, Bret Johnson. mtdt 2006: 49-54 [doi]

2005

Investigations of Faulty DRAM Behavior Using Electrical Simulation Versus an Analytical ApproachZaid Al-Ars, Said Hamdioui, Jörg E. Vollrath. ats 2005: 434-439 [doi]

2003

Output Timing Measurement Using an Idd MethodJörg E. Vollrath. mtdt 2003: 43-46 [doi]

Testing and Characterization of SDRAMsJörg E. Vollrath. dt, 20(1):42-50, 2003. [doi]

2002

Signal Margin Analysis for Memory Sense Amplifiers Jörg E. Vollrath. delta 2002: 123-127 [doi]

2001

Pseudo fail bit map generation for RAMs during component test and burn-in in a manufacturing environmentJörg E. Vollrath, Randall Rooney. itc 2001: 768-775

Compressed Bit Fail Maps for Memory Fail Pattern ClassificationJörg E. Vollrath, Ulf Lederer, Thomas Hladschik. et, 17(3-4):291-297, 2001. [doi]

2000

Synchronous Dynamic Memory Test Construction: A Field ApproachJörg E. Vollrath. mtdt 2000: 59-64 [doi]

Compressed bit fail maps for memory fail pattern classificationJörg E. Vollrath, Ulf Lederer, Thomas Hladschik. ets 2000: 125-130 [doi]

1999

Tutorial: Characterizing SDRAMSJörg E. Vollrath. mtdt 1999: 62 [doi]

1998

Power Analysis of DRAMsJörg E. Vollrath, Markus Huebl, Ernst Stahl. ats 1998: 334-339 [doi]

1997

Cell Signal Measurement for High-Density DRAMsJörg E. Vollrath. itc 1997: 209-216

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