Compressed Bit Fail Maps for Memory Fail Pattern Classification

Jörg E. Vollrath, Ulf Lederer, Thomas Hladschik. Compressed Bit Fail Maps for Memory Fail Pattern Classification. J. Electronic Testing, 17(3-4):291-297, 2001. [doi]

Authors

Jörg E. Vollrath

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Ulf Lederer

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Thomas Hladschik

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